Membership List of ANSI/OEOSC TAG to ISO/TC 172
SC 5 – Microscopes & Endoscopes
WG 3 Terms and definitions
WG 6 Endoscopes
WG 9 Optical performance of microscope components
WG 10 Systems Microscopy
NAME / COMPANY
Anthony Asmar
National Institute for Standards and Technology
Maciej Dybiec
STERIS Instrument Management Services (IMS)
Michael Halter
NIST
Joseph LoBiondo
Nikon Instruments USA
Caroline Miller
HistoExpert
Bruce Radl
Precision Optics Corporation
Stephen Ross
Nikon Instruments USA
Stanley Schwartz
Nikon Instruments USA
David Shafer
Intuitive Surgical
Joel Silfies
Nikon Instruments USA
Zachary Strobehn
CMM Optic
Linh Tran
Intuitive Surgical
Kirsten Viering
Boston Scientific
Quanzeng Wang
FDA, Center for Devices and Radiological Health (CDRH)
Jurgen Zobel
STERIS Instrument Management Services (IMS)
COMMITTEE
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
sc5-wg6
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
sc5-wg3
sc5-wg10
sc5-wg10
sc5-wg6
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
SC5 – Leader
US TC172 TAG Chair
sc5-wg6
sc5-wg3
sc5-wg9
sc5-wg10
sc5-wg9
sc5-wg10
sc1-wg1
sc1-wg2
sc1-wg3
sc1-wg4
sc1-wg2
sc1-wg3
sc1-wg4
sc3-wg2
sc4-wg2
sc4-wg3
sc4-wg3
sc5-wg9
sc5-wg6
sc5-wg6
sc5-wg6
sc5-wg6