ASC OP Roster
TF2 – Surface Imperfections
NAME / COMPANY
Dave Aikens
Savvy Optics Corp.
Patrick Augino
Optimax Systems, Inc.
Matthew Brophy
Optimax Systems, Inc.
Nathan Carlie
Edmund Optics
Xu Chen
Ansys
Marla Dowell
NIST
Dan Gray
Gray Optics
Eric Herman
SYNOPSYS
Donna Howland
Brian Monacelli
Pasadena City College Laser Technology Program
Maria Nadal-Laracuente
NIST
Jay Nelson
Edmund Optics Inc.
Adam Phenis
AMP Optics LLC
Rick Plympton
Optimax Systems, Inc.
Nancy Renke
Gage-Line Technology, Inc.
Michael Rinkus
OptiPro Systems, LLC
Brian Stamper
Nikon Research Corporation of America
Erik Stover
M3 Measurement Solutions Inc.
Zachary Strobehn
CMM Optic
Peter Takacs
Surface Metrology Solutions LLC
Michael Thomas
Spica Technologies, Inc.
Trey Turner
Excelitas
Ray Williamson
Ray Williamson Consulting
Richard Youngworth
Riyo LLC